[labnetwork] seeking X-ray reflectometry capability

[John D Shott]

Fred:

While I personally know nothing about X-ray Reflectivity, the Stanford Nanocharacterization Lab has a couple of diffractimeters that have a reflectivity package on them.

Here is the link

http://web.stanford.edu/group/glam/xlab/Main.htm

On that page there is contact information for Arturas Vaillonis who is the expert on those tools and should be able to tell you if he can help you with your measurements.

Good luck,

John

Sent from my iPhone

On Jun 22, 2016, at 5:41 PM, "Fred Newman" <fnewman at uw.edu<mailto:fnewman at uw.edu>> wrote:

Dear Colleagues,

I am looking for an X-ray reflectometry (XRR) capability for the characterization of thin metallic films (<100 nm) on Si and SiO2 surfaces.  By any chance does anyone on this mailing list have access to such a measurement technique, or a use a laboratory that performs these measurements?

Many thanks!
Fred


--
Fred Newman
Research Engineer
Washington Nanofabrication Facility (WNF)
University of Washington
Fluke Hall 132, Box 352143
office 206 616 3534
mobile 505 450 4447
fnewman at uw.edu<mailto:fnewman at uw.edu>
https://www.wnf.washington.edu/
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