[labnetwork] seeking X-ray reflectometry capability

[Mac Hathaway]

Hi Fred,

This is Mac, at Harvard CNS.  We don't have this capability at CNS, but 
there is another XRD center across the street that is available.  I 
don't know if they do remote work (i.e. I think you have to be there in 
person).

However, I'm pretty sure most XRD (X-Ray Diffraction) systems are able 
to XRR as well, so you might check around your campus/area for one of 
those...


Mac


Mac Hathaway

Senior Process and Systems Engineer

Harvard Center for Nanoscale Systems

11 Oxford St.

Cambridge, MA02138

617-495-9012


On 6/22/2016 4:02 PM, Fred Newman wrote:
> Dear Colleagues,
>
> I am looking for an X-ray reflectometry (XRR) capability for the 
> characterization of thin metallic films (<100 nm) on Si and SiO2 
> surfaces.  By any chance does anyone on this mailing list have access 
> to such a measurement technique, or a use a laboratory that performs 
> these measurements?
>
> Many thanks!
> Fred
>
>
> -- 
> Fred Newman
> Research Engineer
> Washington Nanofabrication Facility (WNF)
> University of Washington
> Fluke Hall 132, Box 352143
> office 206 616 3534
> mobile 505 450 4447
> fnewman at uw.edu <mailto:fnewman at uw.edu>
> https://www.wnf.washington.edu/ 
> <https://urldefense.proofpoint.com/v2/url?u=https-3A__www.wnf.washington.edu_&d=CwMFaQ&c=WO-RGvefibhHBZq3fL85hQ&r=TEMLD8-VsxCGtcVzmvpT5GFNSczskEKHzW6aYlttmIY&m=dM1T3CVZHraFxxGgjH6AWF1PXPzU6zD1O7j3NVxK6R8&s=Vj-Qq4C7gm-dqaPduzorlzcirrHZzHdppfWy_fGuHcY&e=>
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>
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