[labnetwork] Challenging Oxide Etch Process

N P Vamsi Krishna vamsinittala at gmail.com
Thu Feb 18 11:50:40 EST 2021


Hi Ron,
I would try reducing the etch powers/parameters and develop a very low
power recipe. Leave a few nanometers of oxide in the dry etch (making sure
gold is not exposed) and the final mile oxide etch can be in the BOE.
or Cr/Au/Cr instead of Cr/Au and then wet etch chrome.

Thanks & br,
vamsi


On Thu, Feb 18, 2021 at 8:35 AM Demis D. John <demis at ucsb.edu> wrote:

> We would generally permit this, although discourage it for volume or more
> frequent use.  But one time would be acceptable.  We would recommend using
> a system equipped with a laser etch monitor
> <https://wiki.nanotech.ucsb.edu/wiki/Laser_Etch_Monitoring> to minimize
> overetch into the Au.
> We could run this etch if you need it, using our Fluorine ICP
> <https://wiki.nanotech.ucsb.edu/wiki/Fluorine_ICP_Etcher_(PlasmaTherm/SLR_Fluorine_ICP)>.
> Since the Au will only be exposed for a short time, risk of sputtering in
> the tool is low.  However, the Au will likely get sputtered onto the etched
> SiO2 sidewalls - which should be acceptable if the next step is further
> metallization through the via.
>
> Contact me privately if you want to discuss further.
>
> On Wed, Feb 17, 2021 at 12:49 PM Reger, Ronald K <rreger at purdue.edu>
> wrote:
>
>> Dear Colleagues,
>>
>>
>>
>> One of our faculty members has a process he needs to run in which
>> nano-scale oxide definition is required to expose a gold contact pad.  With
>> our shared-use RIEs we are very concerned about Au contamination in our
>> etch tools, particularly for our electron device researchers.  We’re
>> seeking your input from your facilities whether you may have etch tools
>> that allow Au processing for these specialty kinds of processes, and if you
>> have a procedure for dealing with such contamination.  A generic sketch
>> about what our faculty member needs is shown below.
>>
>>
>>
>> So, have you dealt with this contamination issue with your multi-use
>> tools before, and how do you deal with mitigating the contamination?  Do
>> any of you have a tool that could be used by this research group?
>>
>>
>>
>> Thanks very much in advance.
>>
>>
>>
>> Ron Reger
>>
>> Birck Nanotechnology Center
>>
>> Purdue University
>>
>>
>>
>>
>>
>> *Generic process steps*:
>>
>>
>>
>> Fabrication need: metal connection to a sub-micron-size metal pad buried
>> under <=50nm ALD oxide (HfO2 or Al2O3).
>>
>> Conventional fabrication steps (see sketch attached):
>>  (1) cover metal pad with etch-resistive metal, e.g. Au,
>>  (2) ALD-grow oxide (20-50nm),
>>  (3) define a sum-micron PMMA mask using e-beam lithography,
>>  (4) dry etch oxide with Au serving as a stop-etch layer (ICP-assisted
>> etch using BCl3 or SF6 gases),
>>  (5-6) subsequent standard e-beam lithography to connect the exposed Au
>> pad to the outside circuit.
>>
>> Problem: Au (or any other metal which forms non-volatile compounds in RIE
>> system) may be problematic for some electron device processes and is
>> restricted from being used in shared-use RIE oxide etchers.
>>
>> Current work-around: for large (>10 micron) pads steps (3-4) can be
>> performed by optical lithography + wet etch in HF. e-beam resists like PMMA
>> are attacked by HF and this work-around cannot be used if sub-micron
>> lithography is needed.
>>
>>
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-- 

___________________________________________________

N.P.  Vamsi Krishna, PhD

*Staff Scientist*

Pritzker School of Molecular Engineering, *The University of Chicago *

*Resident **Associate*

Center for Nanoscale Materials, *Argonne National Laboratory *

Phone: 1 (331) 757-8565
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