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<div style="direction: ltr;font-family: Tahoma;color: #000000;font-size: 10pt;">We have the capability and expertise at the MINT Center in Alabama, and my graduate student can do the work for you at the rate of $5 per hour.
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<div>Best regards,</div>
<div>Su Gupta<br>
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<div id="divRpF628046" style="direction: ltr;"><font face="Tahoma" size="2" color="#000000"><b>From:</b> labnetwork-bounces@mtl.mit.edu [labnetwork-bounces@mtl.mit.edu] on behalf of J Provine [jprovine@stanford.edu]<br>
<b>Sent:</b> Wednesday, June 22, 2016 8:03 PM<br>
<b>To:</b> Fred Newman<br>
<b>Cc:</b> labnetwork@mtl.mit.edu<br>
<b>Subject:</b> Re: [labnetwork] seeking X-ray reflectometry capability<br>
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<div>This is available at Stanford and is available to outside users. The tool is part of the Stanford nano shared facilities. If you would like more information please let me know. <span></span>
<div>J<br>
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On Wednesday, June 22, 2016, Fred Newman <<a href="mailto:fnewman@uw.edu" target="_blank">fnewman@uw.edu</a>> wrote:<br>
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<div dir="ltr">Dear Colleagues,
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<div>I am looking for an X-ray reflectometry (XRR) capability for the characterization of thin metallic films (<100 nm) on Si and SiO2 surfaces. By any chance does anyone on this mailing list have access to such a measurement technique, or a use a laboratory
that performs these measurements? </div>
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<div>Many thanks!</div>
<div>Fred</div>
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<div style="color:rgb(0,0,0); font-family:Helvetica; font-size:12px">Fred Newman</div>
<div style="color:rgb(0,0,0); font-family:Helvetica; font-size:12px">Research Engineer</div>
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Washington Nanofabrication Facility (WNF)<br>
University of Washington</div>
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Fluke Hall 132, Box 352143</div>
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office 206 616 3534</div>
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mobile 505 450 4447</div>
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<a href="UrlBlockedError.aspx" target="_blank">fnewman@uw.edu</a></div>
<div style="word-wrap:break-word"><font color="#000000" face="Helvetica"><span style="font-size:12px"><a href="https://www.wnf.washington.edu/" target="_blank">https://www.wnf.washington.edu/</a></span></font><br>
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