[labnetwork] seeking X-ray reflectometry capability

[Fred Newman]

Dear Colleagues,

I am looking for an X-ray reflectometry (XRR) capability for the
characterization of thin metallic films (<100 nm) on Si and SiO2 surfaces.
By any chance does anyone on this mailing list have access to such a
measurement technique, or a use a laboratory that performs these
measurements?

Many thanks!
Fred


-- 
Fred Newman
Research Engineer
Washington Nanofabrication Facility (WNF)
University of Washington
Fluke Hall 132, Box 352143
office 206 616 3534
mobile 505 450 4447
fnewman at uw.edu
https://www.wnf.washington.edu/
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